PowerApps --- Excitation Systems
Validation
and Results
Single
Machine – Infinite Bus (SMIB) Benchmark
Highlights:
i.
Comparison between PowerApps Transient Stability Simulation results and
a SMIB System Benchmark [2]. [Refer Chapter 13, Example 13.2, pp 864-869]
ii. Comparison
of generator absolute rotor angle, exciter output voltage, active power output,
and terminal voltage responses.
iii. Models
of AVR used are IEEE type 1 excitation system, IEEE type 2 excitation system,
IEEE type 4 excitation system, and IEEE type 5 excitation system. The
parameters of each of these excitation models were chosen to match with the
simplified excitation system model of the text book example, with the objective
of making comparison between PowerApps simulation and the text book results.
1. System
Description
A single machine
infinite bus system transient stability study is applied in this validation
case. The system is well documented [2]. The system consists of a generator, a
bus and an infinite bus connected by transmission lines as shown in Figure 1.
The infinite bus is modeled in PowerApps as a generator with large MVA rating
connected to a bus.

Figure 1 SMIB Benchmark System SLD
2. System
Data
a. Bus
Data:
|
Bus No.
|
Pg (MW)
|
Qg (Mvar)
|
Pl (MW)
|
Ql (MW)
|
Bus Volt (KV)
|
Vsp (p.u)
|
Asp (p.u)
|
|
LT
|
1998
|
0
|
0
|
0
|
24
|
1
|
0
|
|
INFBUS
|
0
|
0
|
0
|
0
|
230
|
0.90081
|
0
|
Table 1 Bus Data (SMIB)
b. Line
Data:
|
From --> To
|
R (p.u)
|
X (p.u)
|
B2 (p.u)
|
|
HT --> INFBUS
|
0
|
0.5
|
0
|
|
HT --> INFBUS
|
0
|
0.93
|
0
|
Table 2 Line Data (SMIB)
c. Transformer
Data:
|
From --> To
|
R (p.u)
|
X (p.u)
|
Tmax
|
Tmin
|
MVA Rating
|
Tstep
|
|
LT --> HT
|
0
|
0.15
|
0
|
0
|
2220
|
0
|
Table 3 Transformer Data (SMIB)
d. Transient
Data:
|
Generator
|
MCTYPE
|
H
|
Ra
|
Xd
|
X'd
|
X''d
|
T'd0
|
T''do
|
Xl
|
Xq
|
X'q
|
X''q
|
T'q0
|
T''q0
|
KD
|
|
INFGEN
|
0
|
99999
|
0
|
0
|
0.0001
|
0.00001
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
|
LTGEN
|
2
|
3.5
|
0.003
|
1.81
|
0.3
|
0.23
|
8
|
0.03
|
0.15
|
1.76
|
0.65
|
0.25
|
1
|
0.07
|
0
|
Table 4 Transient Data (SMIB)
MCTYPE = 0, the
machine model is Classical.
MCTYPE = 1, the
machine model is Transient (i.e. Two-Axis Transient model with variable
voltages E’d and E’q behind transient reactances X’q and X’d)
MCTYPE =2, the
machine model is Sub-Transient (i.e. Two-Axis-Sub-transient Model with variable
voltages E”q and E”d behind sub-transient reactances X”d and X”q)
e. Excitation
System - 1 Data:
|
Generator
|
TR
|
TA
|
TE
|
TF
|
KA
|
KF
|
KE
|
EFDMAX
|
EFDMIN
|
AEX
|
BEX
|
|
LTGEN
|
0.015
|
0.0001
|
0.0001
|
0.0001
|
200
|
0
|
1
|
7
|
-6.4
|
0
|
0
|
Table 5 Transient Data (SMIB)
The excitation system used for the
generator is IEEE Type 1 excitation system.
3. Disturbance
Scenario and Events
Maximum time of
Simulation = 3.8 s
Step size = 1 ms
Simulation events
for this system are set up as follows:
i.
3-Phase Fault at the end of LIN2 (near HT) at t = 1
ii.
Clearing fault at t = 1.06 seconds by opening LIN2

Figure 2 Load Flow results for SMIB using PowerApps
4. Simulation
Result Comparisons with the SMIB Benchmark System
In these studies,
the generator absolute rotor angle, active power output, exciter output voltage
and terminal voltage responses of LTGEN with different AVR's will be
investigated following the simulation events. Different plots showing the
generator absolute rotor angle, Active power output, exciter output voltage and
terminal voltage simulation results by PowerApps and the SMIB Benchmark System
as published [2].
a. Study
1 (IEEE Type 1)
|
Generator
|
TR
|
TA
|
TE
|
TF
|
KA
|
KF
|
KE
|
EFDMAX
|
EFDMIN
|
AEX
|
BEX
|
|
LTGEN
|
0.015
|
0.0001
|
0.0001
|
0.0001
|
200
|
0
|
1
|
7
|
-6.4
|
0
|
0
|
Table
6 Excitation System - 1 Data (SMIB)
b. Study
2 (IEEE Type 2)

|
Generator
|
TR
|
TA
|
TE
|
TF1
|
TF2
|
TF3
|
KA
|
KE
|
KF
|
EFDMAX
|
EFDMIN
|
AEX
|
BEX
|
|
LTGEN
|
0.015
|
0.0001
|
0.0001
|
0.0001
|
0
|
0
|
200
|
0
|
1
|
7
|
-6.4
|
0
|
0
|
Table
7 Excitation System - 2 Data (SMIB)
c. Study
3 (IEEE Type 4)

|
Generator
|
TR
|
TA
|
TB
|
TC
|
KA
|
KC
|
VIMIN
|
VIMAX
|
VRMIN
|
VRMAX
|
|
LTGEN
|
0.015
|
0.0001
|
0.0001
|
0.0001
|
200
|
0
|
-10
|
10
|
7
|
-6.4
|
Table
8 Excitation System - 4 Data (SMIB)
d. Study
4 (IEEE Type 5)

|
Generator
|
TR
|
TA
|
TE
|
TF1
|
TF2
|
TF3
|
KA
|
KE
|
KF
|
EFDMAX
|
EFDMIN
|
AEX
|
BEX
|
|
LTGEN
|
0.015
|
0.0001
|
0.0001
|
0.0001
|
0
|
0
|
200
|
0
|
1
|
7
|
-6.4
|
0
|
0
|
Table
9 Excitation System - 5 Data (SMIB)

Figure 7 Exciter Output voltage Response from SMIB benchmark


Figure 9 Generator Active Power Output Response from SMIB benchmark


Figure 11 Generator Relative Rotor Angle Responses from SMIB benchmark


Figure 13 Generator terminal voltage Response from SMIB benchmark

The generator rotor angle,
exciter output voltage, terminal voltage and active power output are compared
in figures 7 to 14. Note that there are some minor differences between the
responses obtained from PowerApps and SMIB benchmark. These differences can be
attributed to the fact that critical clearing time for the SMIB benchmark [2]
is 0.07 seconds (fault cleared at 1.07 seconds). However in PowerApps, fault is
cleared at 1.06 seconds to obtain a matching response. The reason is that the
SMIB benchmark example models synchronous machine saturation resulting in
optimistic solution for synchronous machine. PowerApps does not model the same.
Another reason for differences can be due to differences in excitation system
approximation.
5. Conclusion
The PowerApps Transient Stability
generated simulation results for the generator rotor angle, exciter output
voltage, active power output, and terminal voltage in studies performed have
some minor differences between the responses obtained. These differences can be
due differences in fault clearing time, generator models and excitation system
models.
References:
1. P.M.
Anderson and A.A. Fouad, “Power System Control and Stability”, 2nd
Edition, John Wiley & Sons, Inc., Publication, 2003.
2.
Prabha Kundur, “Power System Stability and Control”,
McGraw Hill, Inc., 1994.
3.
IEEE
Recommended Practice for Excitation System Models for Power System Stability
Studies, IEEE Std 421.5™-2005 (Revision of IEEE Std 421.5-1992).